(Single-card) Device perf regressions #3595
jaykru-ttperf-device-models.yaml
on: workflow_dispatch
build-artifact-profiler
/
...
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build-docker-image
17s
Matrix: build-artifact-profiler / build-artifact
Matrix: device-perf / device-perf
Annotations
6 errors and 8 notices
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device-perf / N300 WH B0 device perf
Process completed with exit code 1.
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device-perf / N300 WH B0 device perf
Process completed with exit code 2.
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device-perf / GS device perf
Process completed with exit code 2.
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pcie-cards-are-being-used-cleanup
Tenstorrent cards seem to be in use. Killing PIDs and exiting unsuccessfully. This can happen if a test hung and is normally an issue with the test, rather than infra.
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device-perf / GS device perf
Process completed with exit code 1.
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device-perf / GS device perf
The action 'Run device performance regressions' has timed out after 40 minutes.
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printing-out-smi-info-cleanup
Touching and printing out SMI info
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successful-reset-cleanup
tt-smi reset was successful
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reset-successful-cleanup
tt-smi reset was successful
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disk-usage-before-startup
Disk usage is 59 %
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disk-usage-after-startup
Disk usage is 59 %
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printing-smi-info-startup
Touching and printing out SMI info
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reset-successful-startup
tt-smi reset was successful
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printing-out-smi-info-cleanup
Touching and printing out SMI info
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Artifacts
Produced during runtime
| Name | Size | |
|---|---|---|
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TTMetal_build_grayskull_profiler
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306 MB |
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TTMetal_build_wormhole_b0_profiler
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306 MB |
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