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remove the test from the line if it fixed in the testcuite: 00087, 00088, 00089, 00124, 00159, 00189, 00209, 00210, 00216: TODO segfault at address 0x10 while tool run
typedefunsigned short uint16_t;
typedefunsigned charuint8_t;
typedefunionUnaligned16a {
uint16_tu;
uint8_tb[2];
} __attribute__((packed)) Unaligned16a;
typedefunion__attribute__((packed)) Unaligned16b {
uint16_tu;
uint8_tb[2];
} Unaligned16b;
externvoidfoo (void) __attribute__((stdcall));
void __attribute__((stdcall)) foo (void)
{
}
/* The actual attribute isn't important, must just be parsable. */#defineATTR __attribute__((__noinline__))
intATTRactual_function() {
return42;
}
externintprintf (constchar*, ...);
intmain()
{
void*function_pointer=&actual_function;
inta= ((ATTRint(*) (void)) function_pointer)();
printf("%i\n", a);
/* In the following we once misparsed 'ATTR *' is a btype and hence the whole type was garbled. */intb= ( (int(ATTR*)(void)) function_pointer)();
printf("%i\n", b);
return0;
}
The text was updated successfully, but these errors were encountered:
remove the test from the line if it fixed in the testcuite:
00087, 00088, 00089, 00124, 00159, 00189, 00209, 00210, 00216: TODO segfault at address 0x10 while tool run
tests:
https://github.com/c-testsuite/c-testsuite/blob/master/tests/single-exec/00210.c
The text was updated successfully, but these errors were encountered: